The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2014

Filed:

Apr. 22, 2011
Applicants:

Sumio Kumashiro, Kyoto, JP;

Wenjian Sun, Shanghai, CN;

LI Ding, Manchester, GB;

Inventors:

Sumio Kumashiro, Kyoto, JP;

Wenjian Sun, Shanghai, CN;

Li Ding, Manchester, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/10 (2006.01); H01J 49/24 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/10 (2013.01); H01J 49/24 (2013.01); H01J 49/161 (2013.01); H01J 49/165 (2013.01); H01J 49/164 (2013.01);
Abstract

The current invention involves a method and a device for generating and analyzing ions in order to analyze samples directly without sample preparation. The gaseous neutral molecules are desorbed under atmospheric pressure by a desorption method. The desorbed neutral molecules are then transferred into a low pressure region where they are post-ionized by a mist from an electrospray probe tip or by photons from a vacuum UV source. The generated ions are then focused in a time varying electric field in the low pressure chamber before they are transferred into a mass spectrometer or ion mobility spectrometer for further analysis.


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