The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Nov. 28, 2011
Applicants:

Yuuki Asada, Obu, JP;

Naoki Ito, Nagoya, JP;

Kyouichi Suzuki, Toyohashi, JP;

Norio Fujimori, Nagoya, JP;

Inventors:

Yuuki Asada, Obu, JP;

Naoki Ito, Nagoya, JP;

Kyouichi Suzuki, Toyohashi, JP;

Norio Fujimori, Nagoya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A debug circuit of a microcomputer, providing an on-chip debug function, is provided as a measurement permission circuit for outputting a measurement permission signal to a timer that measures, as a measurement object, a time period between two events in a program execution period of the CPU, according to a user-specified condition. The measurement permission circuit includes an interrupt level register for setting an interrupt level that either permits or prohibits a time measurement operation of the timer, and a comparator for determining by comparison a high-low relationship between an interrupt level of an interrupt process executed by the CPU and an interrupt level set in the interrupt level register, and a determination result of the comparator is specified as the measurement permission signal.


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