The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Dec. 21, 2011
Applicants:

Chenhui Fan, Shanghai, CN;

Lun Zhou, Shanghai, CN;

Stephen Todd, Shrewsbury, MA (US);

Qiyan Chen, Shanghai, CN;

Tianqing Wang, Shanghai, CN;

Inventors:

Chenhui Fan, Shanghai, CN;

Lun Zhou, Shanghai, CN;

Stephen Todd, Shrewsbury, MA (US);

Qiyan Chen, Shanghai, CN;

Tianqing Wang, Shanghai, CN;

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30286 (2013.01);
Abstract

Techniques are disclosed for generating data provenance associated with a computing system. For example, a method comprises the following steps. Information associated with the execution of a given process in a given computing environment in accordance with a given process data set is captured. A provenance data set is generated based on the captured information. The generated provenance data set comprises one or more states associated with one or more execution components of the given computing environment that existed during the execution of the given process. At least a portion of the generated provenance data set may be utilized to revert the computing environment back to the one or more states associated with the one or more execution components of the given computing environment that existed during the execution of the given process.


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