The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Oct. 14, 2012
Applicant:

Panaya Ltd., Raanana, IL;

Inventors:

Yossi Cohen, Raanana, IL;

Mati Cohen, Raanana, IL;

Nurit Dor, Raanana, IL;

Dror Weiss, Netanya, IL;

Roy Armoni, Givat Ada, IL;

Assignee:

Panaya Ltd., Raanana, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for accessing impact analysis repositories and transaction-refinement index for each of the impact analysis repositories. According to the obtained transaction-refinement index, associating the combined repository with information from the most transaction refined impact analysis repository. Associating the combined repository with information from the less transaction refined impact analysis repository in the case of a request to insert or delete a table record for tables that do not contain any impacted transaction in the more transaction refined impact analysis repository. And associating the combined repository with information from the less transaction refined impact analysis repository in the case of a request to update a table record for table columns that do not contain any impacted transaction in the more transaction refined impact analysis repository.


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