The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
May. 13, 2010
Peter Zei-chan Yeh, San Jose, CA (US);
Colin Anil Puri, Sugar Land, TX (US);
Peter Zei-Chan Yeh, San Jose, CA (US);
Colin Anil Puri, Sugar Land, TX (US);
Accenture Global Services Limited GmbH, Shauffhausen, CH;
Abstract
Embodiments of the present invention solve the technical problem of identifying, collecting, and managing rules that improve poor quality data on enterprise initiatives ranging from data governance to business intelligence. In a specific embodiment of the present invention, a method is provided for producing data quality rules for a data set. A set of candidate conditional functional dependencies are generated comprised of candidate seeds of attributes that are within a certain degree of relatedness in the ontology of the data set. The candidate conditional functional dependencies are then applied to the data refined until they reach a quiescent state where they have not been refined even though the data they have been applied to has been stable. The resulting refined candidate conditional functional dependencies are the data enhancement rules for the data set and other related data sets. In another specific embodiment of the present invention, a computer system for the development of data quality rules is provided having a rule repository, a data quality rules discovery engine, and a user interface.