The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Dec. 07, 2012
Korea Basic Science Institute, Daejeon, KR;
Ki Soo Chang, Daejeon, KR;
Seon Young Ryu, Chungcheongbuk-do, KR;
Sun Cheol Yang, Daejeon, KR;
Geon Hee Kim, Daejeon, KR;
Hae Young Choi, Chungcheongbuk-do, KR;
Korea Basic Science Institute, Daejeon, KR;
Abstract
Provided is an imaging system which includes an optical fiber array probe unit integrated with an endoscope unit, thereby simultaneously measuring structural information and functional information of a sample. The optical fiber array probe unit includes an optical fiber array probe integrated with lenses including an optical fiber lens with a lens surface of a predetermined radius of curvature in which one ends of optical fibers are integrally connected with each other by heating a predetermined region including the one ends of two of the optical fibers using a heating means, as an optical fiber array probe integrated lens on which the light transmitted from the light source is incident and which guides light reflected from the sample, and a detector for selectively detecting the light transmitted from the optical fiber array probe integrated with lenses in a predetermined range of wavelength.