The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Nov. 03, 2006
Applicants:

Kevin S. Meagher, Bowie, MD (US);

James M. Allard, Middletown, MD (US);

Michael S. Brown, Baltimore, MD (US);

Inventors:

Kevin S. Meagher, Bowie, MD (US);

James M. Allard, Middletown, MD (US);

Michael S. Brown, Baltimore, MD (US);

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04B 10/12 (2011.01);
U.S. Cl.
CPC ...
Abstract

The present invention utilizes external synchronization to generate a completely standardized or functionally standardized optical transmission unit of level k (OTUk[V]) signal providing less jitter and wander build-up through a network of optical transport network (OTN) elements. This increases noise margins of transported signals and payloads. The present invention provides stratum-level synchronization utilizing a standards-based approach. In one embodiment of the present invention, rate adapters are included to provide m/n scaling of OTUk[V] signals to rates common in SONET and SDH synchronizers to provide line and loop distribution of timing through OTUk[V] signals. The present invention provides a choice of external synchronization sources including building integrated timing source (BITS), line, and loop timing sources. In another exemplary embodiment, the present invention provides multiple external references and automated timing protection switching for redundancy and reliability.


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