The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Dec. 10, 2009
Christian Baeumer, Dorsten-rhade, DE;
Gereon Vogtmeier, Aachen, DE;
Christian Baeumer, Dorsten-rhade, DE;
Gereon Vogtmeier, Aachen, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The present invention relates to an examination apparatus and a corresponding method to realize a Spectral x-ray imaging device through inverse-geometry CT. The proposed examination apparatus comprises: an X-ray source unit () comprising a plurality of X-ray sources () for emitting X-rays () at a plurality of locations, an X-ray detection unit () for detecting X-rays emitted from one or more of said X-ray sources () after penetration of an examination area () between said X-ray source unit () said X-ray detection unit () and for generating detection signals, a processing unit () for processing the generated detection signals, and—a control unit () for controlling said X-ray sources () to subsequently, alone or in groups emit X-rays at least two different energy spectra such that in the time interval, during which a particular X-ray source () or said group of X-ray sources (), is switched over to emit X-rays at a different energy spectrum, said particular X-ray source () or said group of X-ray sources () is switched off and one or more other X-ray sources () or groups of X-ray sources () are subsequently switched on to emit X-rays.