The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Nov. 30, 2010
Applicants:

Tetsuya Shirota, Tokyo, JP;

Katsuyoshi Yamaguchi, Tokyo, JP;

Minoru Sukekawa, Tokyo, JP;

Inventors:

Tetsuya Shirota, Tokyo, JP;

Katsuyoshi Yamaguchi, Tokyo, JP;

Minoru Sukekawa, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a microscope controller by which is performed an operation for controlling an operation of each of a plurality of electric units included in a microscope system, the control unit establishes a plurality of functional areas in the display region of the touch panel as regions for making operable the plurality of electric units. When an input to any of the functional areas is detected, the control unit generates a control instruction signal for controlling an electric unit corresponding to this functional area. The communication control unit transmits the control instruction signal to an external device controlling an operation of a corresponding electric unit. When an input to a predetermined functional area is detected, the control unit then reestablishes a plurality of functional areas within the display region of the touch panel so as to enlarge this functional area or a plurality of specific functional areas including this functional area.


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