The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Oct. 07, 2010
Applicants:

Yusuke Yamashita, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Inventors:

Yusuke Yamashita, Tokyo, JP;

Tatsuo Nakata, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A laser scanning microscope includes a culture vessel that accommodates a specimen and is capable of maintaining an interior temperature and humidity thereof, and an optical system space adjacent and optically connected to the culture vessel. The optical system space includes a scanner that two-dimensionally scans ultrashort pulsed laser light across the specimen; an objective lens that focuses the scanned ultrashort pulsed laser light on the specimen and collects light coming from the specimen; a dichroic mirror, disposed between the scanner and the objective lens, that splits off the light coming from the specimen from the laser light; a photodetector that detects the split-off light coming from the specimen; and an outer cover, provided so as to surround the optical system space, that blocks light coming from outside the optical system space.


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