The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Apr. 11, 2006
Applicants:

Yoshihiko Nakamura, Tokyo, JP;

Katsu Yamane, Tokyo, JP;

Hiroaki Tanie, Tokyo, JP;

Inventors:

Yoshihiko Nakamura, Tokyo, JP;

Katsu Yamane, Tokyo, JP;

Hiroaki Tanie, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an optical motion capture system, it is possible to measure spatially high-dense data by increasing the number of measuring points. In the motion capture system using a mesh marker, intersections of lines for the mesh marker are called nodes and the lines connecting the nodes are called edges. The system includes a plurality of cameras for capturing a two-dimensional image of the mesh marker by imaging a subject having the mesh marker, a node/edge detecting section for detecting node/edge information on the mesh marker from the two-dimensional image captured by the respective cameras, and a three-dimensional reconstructing section for acquiring three-dimensional position information of the nodes by using the node/edge information detected from the plurality of two-dimensional images captured by different cameras.


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