The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Apr. 03, 2009
David Hasler, Neuchatel, CH;
Peter Masa, Onnens, CH;
Pascal Heim, Saint-Aubin, CH;
Edoardo Franzi, Yverdon-les-Bains, CH;
David Hasler, Neuchatel, CH;
Peter Masa, Onnens, CH;
Pascal Heim, Saint-Aubin, CH;
Edoardo Franzi, Yverdon-les-Bains, CH;
Abstract
A one-dimension position measurement system includes: a first ruler having a first one-dimension binary code sapplied thereon, a camera for acquiring a picture of a portion of the code s, the portion having a length of I bits, and some processing elements. Each codeword of length I of the one-dimension code sis unique within the whole code s. A codeword ais read from the acquired picture, and the processing elements are implemented for computing an absolute position p of the codeword aof the code sfrom: (I). An ad-hoc interpolation method is used to obtain a precision way below the distance between two bits of the codewords. The code smay be applied on the ruler by using some geometric primitives, a geometric primitive for encoding a '1' being different from a geometric primitive for encoding a '0', both having the same horizontal projection. The horizontal projection is then used for fine interpolation, achieving nanometer-scale resolution.