The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

May. 29, 2012
Applicants:

Yong Hwan Moon, Incheon-si, KR;

Young Soo Ryu, Goyang-si, KR;

Jae Ryun Shim, Daejeon-si, KR;

Chul Soo Jeong, Daejeon-si, KR;

Sang Ho Kim, Gunpo-si, KR;

Inventors:

Yong Hwan Moon, Incheon-si, KR;

Young Soo Ryu, Goyang-si, KR;

Jae Ryun Shim, Daejeon-si, KR;

Chul Soo Jeong, Daejeon-si, KR;

Sang Ho Kim, Gunpo-si, KR;

Assignee:

Silicon Works Co., Ltd., Daejeon-Si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a false lock prevention circuit and method which is used to cause a delayed locked loop (DLL) to escape from false lock such as harmonic lock or stuck lock, when the false lock occurred in the DLL, and a DLL using the same. The false lock prevention circuit includes a harmonic lock detector configured to detect harmonic lock and a stuck lock detector configured to detect stuck lock. The harmonic lock detector includes a plurality of flip-flops configured to sample a plurality of delayed clocks and a logic unit. The harmonic lock detector compares a reference clock signal with the plurality of delayed clock signals, and detects whether or not the positive edges deviate from one cycle of the reference clock signal.


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