The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

May. 13, 2009
Applicants:

Tomoaki Yamabayashi, Hokkaido, JP;

Osamu Takahashi, Hokkaido, JP;

Katsunori Kondo, Hokkaido, JP;

Hiroaki Kikuchi, Hokkaido, JP;

Inventors:

Tomoaki Yamabayashi, Hokkaido, JP;

Osamu Takahashi, Hokkaido, JP;

Katsunori Kondo, Hokkaido, JP;

Hiroaki Kikuchi, Hokkaido, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/414 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a sensor having a high sensitivity and a high degree of freedom of layout by reducing constrictions of the channel shape, the reaction field area, and the position. Provided is also a method for manufacturing the sensor. The sensor () includes: a source electrode (), a drain electrode, (), and a gate electrode () arranged on silicon oxide film (); a channel () arranged on the silicon oxide films () and electrically connected to the source electrode () and the drain electrode (); and a reaction field () arranged on the silicon oxide films (). The reaction field () is formed at a position on the silicon oxide film (), the position being different from a position for the channel (). With this configuration, it is possible to independently select the shape of the channel () and the area of the reaction field (). This enables the sensor () to have a high measurement sensitivity and a high degree of freedom of layout.


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