The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Sep. 30, 2011
Hiroshi Sugawara, Kyoto, JP;
Daisuke Okumura, Kyoto, JP;
Hiroshi Sugawara, Kyoto, JP;
Daisuke Okumura, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A high-quality mass spectrum is provided with alleviated mass/charge axis deviation in a triple quadrupole mass spectrometer even when executing a high-speed mass scan with MS/MS analysis. Mass calibration tables which denote relations between m/z and a mass deviation value which scan speed is a parameter are prepared separately for use in MS analyses without involving dissociation operations and MS/MS analyses with involving dissociation operations. According to a measuring mode, such as a product ion scan measurement or a neutral loss scan measurement, when performing MS/MS analysis, a mass deviation value for the minimum scan speed in a table is used for a quadrupole where the selected m/z is fixed, and a mass deviation value for a designated scan speed in a table is used for a quadrupole where the mass scan is performed, thus controlling the operations of each of a pre-stage and a post-stage quadrupoles.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile