The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Aug. 30, 2010
James R. Heil, Denver, CO (US);
Michael J. Lochhead, Boulder, CO (US);
Kevin D. Moll, Boulder, CO (US);
Christopher J. Myatt, Boulder, CO (US);
James R. Heil, Denver, CO (US);
Michael J. Lochhead, Boulder, CO (US);
Kevin D. Moll, Boulder, CO (US);
Christopher J. Myatt, Boulder, CO (US);
MBio Diagnostics, Inc., Boulder, CO (US);
Abstract
A system for sample preparation and analyte detection includes a cartridge, with a fluidic channel, a waveguide, and a capture spot. The system further includes a force field generator, an imaging system, and a fluid, which includes a sample potentially containing a target analyte, first type particles, which include binding moieties specific for the target analyte and are responsive to a force field, and second type particles, which include binding moieties specific for the target analyte and are capable of generating a signal. When the sample contains the target analyte, specific binding interactions between the target analyte and binding moieties link first and second type particles via the target analyte to form multiple-particle complex capturable at a capture spot. The force field allows manipulation of the particles and multiple-particle complex such that the detected signal from the second type particles is indicative of the target analyte within the sample.