The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Dec. 24, 2004
Applicants:

Yasuhito Murata, Kyoto, JP;

Junichi Oka, Kyoto, JP;

Inventors:

Yasuhito Murata, Kyoto, JP;

Junichi Oka, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 23/00 (2006.01); G05D 23/30 (2006.01); G05D 23/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an analyzing apparatus () for analyzing a sample using a container () accommodating reagents sealed therein, while raising the temperature of the reagents up to a predetermined temperature. The analyzing apparatus () comprises a first temperature measuring means () for measuring temperature of the container (), a second temperature measuring means () for measuring temperature around the container (), a heater () for supplying heat energy to the container (), and a controller for controlling the heater () based on a measurement result at the first and second measuring means ().


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