The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Jul. 24, 2008
Applicants:
Naohisa Kamiyama, Otawara, JP;
Yoko Okamura, Otawara, JP;
Inventors:
Naohisa Kamiyama, Otawara, JP;
Yoko Okamura, Otawara, JP;
Assignees:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An ultrasonic diagnostic apparatus removes a speckle pattern using information on a direction (depth direction) that is substantially orthogonal to a plurality of ultrasonic images included in three-dimensional image data. For example, three-dimensional CFAR processing, two-dimensional CFAR processing, and a depth-direction arithmetic process are performed to discriminate a continuous structure that is three-dimensionally arranged from a local microstructure, thereby generating a microstructure extracted image.