The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 15, 2014
Filed:
Jul. 29, 2008
Richard Holley, Maidenhead, GB;
Robin Taylor, Twyford, GB;
Richard Holley, Maidenhead, GB;
Robin Taylor, Twyford, GB;
Lein Applied Diagnostics, Berkshire, GB;
Abstract
An optical measurement apparatus comprises an optical system () having a receiving axis (). The optical system () comprises a source () that generates a probe beam that is directed to a location to be measured (). A detector () of the optical system receives a reflected beam from the location to be measured (). The apparatus also comprises a processing resource that receives an output signal from the detector () and makes an assessment of a characteristic of the output signal in order to determine a degree of alignment of the location to be measured () with the receiving axis () of the optical system ().