The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 2014

Filed:

Dec. 11, 2012
Applicant:

Thales, Neuilly-sur-Seine, FR;

Inventor:

Jacques Mandle, Saint Peray, FR;

Assignee:

Thales, Neuilly sur Seine, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe for measuring a local angle of attack designed to be fixed to a wall and a method implementing the probe are provided. The probe comprises at least three pressure sampling ports disposed over a nose of the probe body, pressure measurement means associated with the pressure sampling ports and calculation means capable of determining an angle of attack of the flow with respect to the main direction of the probe body as a function of the pressures measured by the pressure measurement means. The calculation means are configured for choosing from amongst the pressure sampling ports those allowing the best measurement precision of the local angle of attack to be obtained and for calculating the local angle of attack with respect to the main direction using the pressure measurements carried out in the chosen pressure sampling ports.


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