The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jun. 08, 2012
Fausto Bernardini, New York, NY (US);
Jarir K. Chaar, Ardsley, NY (US);
Yi-min Chee, Yorktown Heights, NY (US);
Joseph P. Huchel, Morgan Hill, CA (US);
Thomas A. Jobson, Jr., New Paltz, NY (US);
Daniel V. Oppenheim, Croton on Hudson, NY (US);
Krishna C. Ratakonda, Yorktown Heights, NY (US);
Fausto Bernardini, New York, NY (US);
Jarir K. Chaar, Ardsley, NY (US);
Yi-Min Chee, Yorktown Heights, NY (US);
Joseph P. Huchel, Morgan Hill, CA (US);
Thomas A. Jobson, Jr., New Paltz, NY (US);
Daniel V. Oppenheim, Croton on Hudson, NY (US);
Krishna C. Ratakonda, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system, and/or computer-readable medium analyzes problems in a software factory. Factory metrics that describe resources and operations within the software factory are collected and analyzed to detect problems that might have occurred during an execution of a work packet within the software factory. If the detected problems exceed one or more threshold criteria, then a detailed analysis of the detected problems is performed by matching each detected problem to one or more specific root causes through an analysis of the factory process building blocks.