The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Jun. 23, 2010
Applicant:

Unto Laine, Vantaa, FI;

Inventor:

Unto Laine, Vantaa, FI;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention allows modeling and searching patterns in a data sequence. A data sequence is analyzed to determine at least two data elements that, when replaced with one replacement data element, will cause a metric of irregularity of the data sequence being analyzed to be maximized. The replacement data element is not included in the data sequence being analyzed. The determined at least two data elements are replaced with the replacement data element thereby generating a residual data sequence. The steps of analyzing and replacing are iterated until reaching a predetermined value of an iteration threshold, wherein with each iteration the analyzing and replacing are applied to the residual data sequence generated in the preceding iteration.


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