The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Aug. 15, 2011
Applicants:

Philip Stephan Schultz, Bellaire, TX (US);

Cory James Hoelting, Houston, TX (US);

Inventors:

Philip Stephan Schultz, Bellaire, TX (US);

Cory James Hoelting, Houston, TX (US);

Assignee:

Chevron U.S.A. Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01V 1/28 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/301 (2013.01); G01V 1/305 (2013.01); G01V 2210/667 (2013.01); G01V 2210/6222 (2013.01);
Abstract

A system and method for subsurface characterization including depth and structural uncertainty estimation is disclosed. In one embodiment, the method may include determining a detectability threshold for moveout in a seismic data gather based on the seismic data and computing a depth uncertainty function, wherein the depth uncertainty function represents an error estimate that is used to analyze an interpretation of the seismic data. In another embodiment, the method may include receiving a depth uncertainty volume and at least one interpreted horizon from seismic data, extracting a depth uncertainty cage for each of the interpreted horizons based on the depth uncertainty volume, and simulating multiple realizations for each of the interpreted horizons, constrained by the depth uncertainty cage. The multiple realizations may be used for analyzing changes to geometrical or structural properties of the at least one interpreted horizon. The changes may be plotted as at least one distribution and may be used to make P10, P50 and P90 estimates.


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