The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Nov. 14, 2005
Michael Tyler, Hillsboro, OR (US);
Robert W. Colby, N. Franklin, CT (US);
Jeffrey W. Leonard, Portland, OR (US);
Lindsey M. Dotson, Portland, OR (US);
David A. Watt, Newark, CA (US);
Cris E. Hill, Portland, OR (US);
Laura H. Campbell, Portland, OR (US);
Michael Tyler, Hillsboro, OR (US);
Robert W. Colby, N. Franklin, CT (US);
Jeffrey W. Leonard, Portland, OR (US);
Lindsey M. Dotson, Portland, OR (US);
David A. Watt, Newark, CA (US);
Cris E. Hill, Portland, OR (US);
Laura H. Campbell, Portland, OR (US);
Electro Scientific Industries, Inc., Portland, OR (US);
Abstract
A method and system increase processed specimen yield in the laser processing of target material that includes multiple specimens formed on a common substrate. Preferred embodiments implement a feature that enables storage in the laser processing system a list of defective specimens that have somehow been subject to error during laser processing. Once the common substrate has been completely processed, the system alerts an operator to the number of improperly processed specimens and gives the operator an opportunity to run a software routine, which in a preferred embodiment uses a laser to scribe a mark on the top surface of each improperly processed specimen.