The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jan. 20, 2012
Cedric F. Lam, Milpitas, CA (US);
Ben W. Segura, Morgan Hill, CA (US);
Ryohei Urata, Sunnyvale, CA (US);
Hong Liu, Palo Alto, CA (US);
Cedric F. Lam, Milpitas, CA (US);
Ben W. Segura, Morgan Hill, CA (US);
Ryohei Urata, Sunnyvale, CA (US);
Hong Liu, Palo Alto, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
A technique for detecting a fiber fault in a WDM optical access network includes launching a test signal into a fiber trunk line linking a central office ('CO') to a remote node ('RN') of the WDM optical access network. The test signal is generated by an optical time domain reflectometry unit to simultaneously fault test fiber access lines linking the RN to customer premises. The test signal is separated from downstream WDM signals at the RN. The test signal is power split at the RN into a plurality of access line test signals. The access line test signals are each recombined with a corresponding one of the downstream WDM signals onto a corresponding one of the fiber access lines. Test signal reflections are received at the CO from the fiber access lines as a reflection signature and analyzed to identify a location of the fiber fault.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile