The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Jul. 06, 2011
Applicants:

Akira Kadoya, Kitanagoya, JP;

Satoru Nakanishi, Nagoya, JP;

Shinichi Kojima, Seto, JP;

Inventors:

Akira Kadoya, Kitanagoya, JP;

Satoru Nakanishi, Nagoya, JP;

Shinichi Kojima, Seto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/48 (2006.01); G06K 9/46 (2006.01); G06K 9/40 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An eyelid detection device that, based on first order differential values and second order differential values of vertical density change at an eyelid boundary in an eye image, shifts the second order differential values upwards by ¼ of the cycle of density change frequency of an eyelid boundary and combines the first order differential values and the second order differential values to compute upper eyelid feature amounts. The eyelid detection device detects a boundary between an upper eyelid and eyeball based on peak points in the vertical direction of the computed upper eyelid feature amounts. Consequently, the boundary between an eyelid and eyeball can be accurately detected even when the eyelid has been applied with makeup.


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