The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jul. 22, 2010
Noboru Nakajima, Tokyo, JP;
Noboru Nakajima, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Provided is a marker generation device which has a feature comparison means and a marker pattern generation means. The feature comparison means disposes feature points extracted from an image in a predetermined space, sets parts in which the number of feature points in the predetermined space is equal to or less than a predetermined number as singular features, disposes feature points extracted from an identifier in the predetermined space, and counts the number of feature points that coincide with the singular features. The marker pattern generation means converts the structure of the identifier and extracts the feature points from the converted identifier. The feature comparison means disposes the feature points extracted from the converted identifier in the predetermined space, counts the number of feature points that coincide with the singular features, and selects, as a marker for detection, an identifier having the most counts from among identifiers before conversion and one or two or more identifiers that have been converted.