The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Apr. 29, 2011
Ping Xue, Pewaukee, WI (US);
Shijia Zhang, Beijing, CN;
Fengchao Zhang, Beijing, CN;
John Robert Lamberty, Oconomowoc, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
German Guillermo Vera, Menomonee Falls, WI (US);
Ping Xue, Pewaukee, WI (US);
Shijia Zhang, Beijing, CN;
Fengchao Zhang, Beijing, CN;
John Robert Lamberty, Oconomowoc, WI (US);
Richard Gordon Cronce, New Berlin, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
German Guillermo Vera, Menomonee Falls, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for controlling a X-ray radiography system includes acquiring data from a digital X-ray detector, characterizing electromagnetic interference based upon the acquired data, selecting an electromagnetic interference compensation algorithm based upon the characterized electromagnetic interference, acquiring X-ray imaging data via the digital X-ray detector based upon the selected electromagnetic interference compensation algorithm, and processing the X-ray imaging data to produce image data capable of reconstruction in a user viewable form.