The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jun. 17, 2011
Simon Russell Bare, Elk Grove Village, IL (US);
Shelly D Kelly, Bolingbrook, IL (US);
Wharton Sinkler, Des Plaines, IL (US);
Nan Greenlay, Des Plaines, IL (US);
Simon Russell Bare, Elk Grove Village, IL (US);
Shelly D Kelly, Bolingbrook, IL (US);
Wharton Sinkler, Des Plaines, IL (US);
Nan Greenlay, Des Plaines, IL (US);
UOP LLC, Des Plaines, IL (US);
Abstract
Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.