The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Nov. 04, 2009
Michael E. Dugas, Londonderry, NH (US);
Lee Grodzins, Lexington, MA (US);
Michael E. Dugas, Londonderry, NH (US);
Lee Grodzins, Lexington, MA (US);
Thermo Scientific Portable Analytical Instruments Inc., Tewksbury, MA (US);
Abstract
Methods and apparatus for adapting the shaping time and/or other pulse processing parameters of an x-ray detector () in accordance with the elemental composition of a sample and/or energy resolving requirements. X-rays () are directed from a source () onto a sample () and the radiation () responsively emitted from the sample (e.g., fluoresced radiation characteristic of the sample's elemental composition) and detected by an x-ray detector () that generates pulses representative of the energy and intensity of the incident radiation. Based upon initial analysis of elemental composition, the shaping time and/or other pulse processing parameter (s) are set to optimize count rate subject to constraints of energy resolution in a spectral region of interest.