The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Aug. 20, 2012
Applicants:

Pradeep K. Singh, Arlington, VA (US);

Alain J. Cohen, Washington, DC (US);

Alejandro Talavera-martinez, Rockville, MD (US);

Arun Pasupathy, McLean, VA (US);

Vinod Jeyachandran, Rockville, MD (US);

Ibrahim Utku Moral, Bethesda, MD (US);

Inventors:

Pradeep K. Singh, Arlington, VA (US);

Alain J. Cohen, Washington, DC (US);

Alejandro Talavera-Martinez, Rockville, MD (US);

Arun Pasupathy, McLean, VA (US);

Vinod Jeyachandran, Rockville, MD (US);

Ibrahim Utku Moral, Bethesda, MD (US);

Assignee:

Riverbed Technology, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/413 (2006.01);
U.S. Cl.
CPC ...
Abstract

The embodiments relate to modeling wireless communications in a network. In wireless communications, the nodes share one or more wireless communication channels. When a node has data to transmit, it must contend with the other nodes for access to the wireless communication channel. In the embodiments, the model is configured to simulate the throughput effects of contention including delays caused by retransmissions due to interference and collisions, listen-and-backoff, unavailability of time slots, etc. The occurrence of failed/dropped transmissions due to buffer overflows, excessive retransmission attempts, and unintended collisions are modeled as well. In addition, the embodiments may simulate the effect of mobility by the nodes and the effect of the location of the nodes relative to each other.


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