The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
May. 03, 2011
Applicants:
Susie J. Wee, Palo Alto, CA (US);
Carri Chan, Stanford, CA (US);
John G. Apostolopoulos, Palo Alto, CA (US);
Inventors:
Susie J. Wee, Palo Alto, CA (US);
Carri Chan, Stanford, CA (US);
John G. Apostolopoulos, Palo Alto, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 1/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
Utilizing multiple distortion measures. A first distortion measure for at least one packet is received. A second distortion measure for the at least one packet is received, wherein the second distortion measure is different than the first distortion measure. A processing operation is performed based at least in part on the first distortion measure and the second distortion measure.