The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Aug. 17, 2010
Applicants:

Yuwen Wu, Cupertino, CA (US);

Yi Ding, Saratoga, CA (US);

Lifen Tian, Sunnyvale, CA (US);

Inventors:

Yuwen Wu, Cupertino, CA (US);

Yi Ding, Saratoga, CA (US);

Lifen Tian, Sunnyvale, CA (US);

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

The systems and method herein provide a design logic that extends Distributed Scan Management (DSM) by integrating the scan setting features of a network scanner with DSM and enhances DSM by providing a means for quickly locating Post Scan Processes (PSP) based on specified search criteria. In this regard, a network scanner is controllable via the PSPs of a DSM protocol. A user interface of the network scanner is operable to receive login information associated with a user that is used to grant access to one or more of the PSPs. The network scanner also includes a storage module operable to store scanner software instructions that direct a processor to determine whether the one or more accessed PSPs have settings that are overrideable and present the one or more accessed PSPs to the user for selection. The user may then override settings of a selected PSP via the user interface.


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