The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jul. 27, 2012
Hiroyuki Ishigaki, Aichi, JP;
Hiroyuki Ishigaki, Aichi, JP;
CKD Corporation, Aichi, JP;
Abstract
A device for measuring three dimensional shape includes a first height data acquisition unit for acquiring a height data specified from measurement values according to a multiplicity of light patterns related to an entirely irradiated region irradiated by all of the multiplicity of light patterns, and for using an acquired specified height data as a height data for the entirely irradiated region; a supplemental data acquisition unit for acquiring, based on the height data for the entirely irradiated region, a supplemental data relating to a partially irradiated region that is irradiated by only part of the multiplicity of light patterns; and a second height acquisition unit for specifying a fringe order of the measurement values for the partially irradiated region based on the supplemental data, and for acquiring as height data for the partially irradiated region a height data corresponding to the measurement values of the specified fringe order.