The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Mar. 14, 2008
Applicant:

Pavel Matousek, Abingdon, GB;

Inventor:

Pavel Matousek, Abingdon, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/65 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 21/65 (2013.01); G01J 3/44 (2013.01);
Abstract

The invention provides a technique for increasing the illumination intensity of probe light in a diffusely scattering sample without increasing the power of the probe beam. Generally, an optical filter is used which permits a collimated probe beam of light to pass through to the sample, but which reflects back towards the sample much of the backscattered scattered probe light emerging at a wider range of angles. In particular embodiments a collimated laser beam is delivered to the sample through a multi-layer dielectric filter covering a portion of the sample. The filter is transmissive to the laser light at normal incidence, but reflective at shallower angles of incidence characteristic of the backscattered light.


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