The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jan. 31, 2012
Applicants:
J. David Schell, Austin, TX (US);
Seymour Goldstein, Austin, TX (US);
Harlan Kassler, Austin, TX (US);
Jackson Salling, Austin, TX (US);
Inventors:
J. David Schell, Austin, TX (US);
Seymour Goldstein, Austin, TX (US);
Harlan Kassler, Austin, TX (US);
Jackson Salling, Austin, TX (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test instrument comprises plural first optical signal sources at a first wavelength and a distributor coupled to the plural first optical signal sources to supply the signals produced to a multi-fiber test port. Additional second wavelength signal sources may be provided, and a second test instrument for use at a second end of the link under test may be provided, to effect testing of the optical link.