The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Feb. 08, 2011
Kunihiko Yoshioka, Nagoya, JP;
Satoshi Ishibashi, Nagoya, JP;
Kunihiko Yoshioka, Nagoya, JP;
Satoshi Ishibashi, Nagoya, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
A fluid observation apparatus for performing a method for observing a fluid by PIV. The method for observing a fluid includes capturing an image of inorganic particles in a fluid for flow observation by irradiating the fluid for flow observation passing through a flow channel with light, the fluid for flow observation containing inorganic particles to be observed each having a planar surface, a dispersion medium to be observed, and a viscosity modifier. The fluid for flow observation is high-viscosity non-Newtonian slurry containing inorganic particles. The fluid for flow observation may be a simulated fluid for a fluid for flow analysis. The simulated fluid closely resembles the particle size of inorganic particles to be analyzed and the viscosity of the fluid for flow analysis. The fluid for flow analysis contains the inorganic particles to be analyzed and a dispersion medium to be analyzed.