The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Jul. 08, 2009
Applicants:
Auguste Genovesio, Seoul, KR;
Neil Emans, Pretoria, RS;
Inventors:
Auguste Genovesio, Seoul, KR;
Neil Emans, Pretoria, RS;
Assignee:
Institut Pasteur Korea, Sungnam Gyeonggi, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for imaging features on a substrate, comprising scanning the substrate and producing an image thereof, overlaying a grid model on the image, fitting the grid model to the locations of at least some of the features on the image, and extracting images of the features.
Genovesio, Auguste. (2014). Method and apparatus for imaging of features on a substrate (U.S. Patent No. 8692876). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8692876
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile