The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Sep. 28, 2009
Hao Lin, Beijing, CN;
Zhangwei Mhng, Beijing, CN;
Shuiyu Nan, Beijing, CN;
Ken Chen, Beijing, CN;
Genglin Huang, Beijing, CN;
Yong Ji, Beijing, CN;
Hao Lin, Beijing, CN;
Zhangwei Mhng, Beijing, CN;
Shuiyu Nan, Beijing, CN;
Ken Chen, Beijing, CN;
Genglin Huang, Beijing, CN;
Yong Ji, Beijing, CN;
Peking University Founder Group Co., Ltd., Beijing, CN;
Beijing Founder Electronics Co., Ltd., Beijing, CN;
Abstract
Disclosed is a method and system for automatically testing a raster image processor. The method may identify the correctness of the bitmap output by the raster image processor to be tested by comparing an abstract code of a bitmap generated by the RIP to be tested with that generated by a reference RIP to determine whether they are consistent with each other, so as to identify the correctness and stability of the RIP to be tested. Furthermore, the test samples can be submitted automatically. Thus, the convenience and efficiency are improved with respect to the manual submitting.