The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Feb. 04, 2011
Atanu Saha, Bangalore, IN;
Krishnamurthy Anand, Bangalore, IN;
Hari Nadathur Seshadri, Bangalore, IN;
Karthick Vilapakkam Gourishankar, Bangalore, IN;
Filippo Cappuccini, Florence, IT;
Atanu Saha, Bangalore, IN;
Krishnamurthy Anand, Bangalore, IN;
Hari Nadathur Seshadri, Bangalore, IN;
Karthick Vilapakkam Gourishankar, Bangalore, IN;
Filippo Cappuccini, Florence, IT;
General Electric Company, Niskayuna, NY (US);
Abstract
A method for use in determining the thickness of a layer of interest in a multi-layer structure. A first electrode is positioned in contact with a first surface of the multi-layer structure, and a second electrode is positioned in contact with a second surface of the multi-layer structure. The second surface is substantially opposite the first surface. The first electrode is pressed against the multi-layer structure at a predetermined sampling pressure, and the structure is optionally adjusted to a predetermined sampling temperature. The electrical impedance between the first electrode and the second electrode is measured.