The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Aug. 25, 2010
Applicants:

Daniel Abenaim, Lynnfield, MA (US);

Gilbert Mckenna, Revere, MA (US);

Inventors:

Daniel Abenaim, Lynnfield, MA (US);

Gilbert McKenna, Revere, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

One or more techniques and/or systems are described herein for handling an examination surface for radiology or other operations. That is, an examination surface support structure can be integrally coupled with a support component of a radiology apparatus so that an examination surface and an object optionally placed thereon are supported during an operation. An examination surface transport component can be docked with an examination surface docking component that is operably coupled with the examination surface support structure so that the examination surface can be exchanged between the transport component and the radiology apparatus. An examination surface transit component that is operably coupled with the examination surface support structure can engage the examination surface in order to move the examination surface into and out of an operation region of the apparatus, such as during a scanning or dosage operation.


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