The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Mar. 23, 2012
Michael W. Belford, Los Altos, CA (US);
Jean-jacques Dunyach, San Jose, CA (US);
Mark E. Hardman, Santa Clara, CA (US);
Michael W. Belford, Los Altos, CA (US);
Jean-Jacques Dunyach, San Jose, CA (US);
Mark E. Hardman, Santa Clara, CA (US);
Thermo Finnigan LLC, San Jose, CA (US);
Abstract
A system for analyzing ions comprises: an ion source; a FAIMS cell comprising: (a) a gas inlet; (b) an outer electrode having a generally concave inner surface and comprising: (i) an ion inlet operable to receive the ions from the ion source and a carrier gas from the gas inlet; and (ii) an ion outlet; and (c) an inner electrode having a conduit therethrough and having a generally convex outer surface disposed in a spaced-apart and facing arrangement relative to the inner surface of the outer electrode defining at least one annular on separation region therebetween; and a mass analyzer for mass analyzing ions transmitted by the FAIMS cell through the ion outlet, wherein the inner electrode is moveable between a first position and a second position, the first and second positions facilitating movement of the ions through the at least one annular ion separation region and the conduit, respectively.