The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Feb. 25, 2013
Applicant:

Inguran, Llc, Navasota, TX (US);

Inventors:

Gary Durack, Urbana, IL (US);

Jeffrey D. Wallace, Rantoul, IL (US);

Gary P. Vandre, Mahomet, IL (US);

Lon A. Westfall, Mahomet, IL (US);

Jeremy T. Hatcher, Urbana, IL (US);

Niraj V. Nayak, Redondo Beach, CA (US);

Assignee:

Inguran, LLC, Navasota, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); C12N 5/076 (2010.01); C12Q 1/02 (2006.01); G01N 21/63 (2006.01); C12N 5/07 (2010.01);
U.S. Cl.
CPC ...
G01N 33/48 (2013.01); C12N 5/061 (2013.01); C12N 5/06 (2013.01); C12Q 1/02 (2013.01); G01N 21/63 (2013.01);
Abstract

A method of analyzing particles in a fluid stream including focusing a generally elliptical beam spot to a width less than the size of the particles. As particles pass through the beam spot electromagnetic radiation from the particles which is then detected and converted into electrical signals indicative of characteristics of the particles. The electrical signals may be digitally sampled to provide digital information which may be analyzed to extract information and to classify the particles.


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