The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2014
Filed:
Sep. 02, 2004
Mitchell R. Toland, Puyallup, WA (US);
Mitchell R. Toland, Puyallup, WA (US);
Weyerhaeuser NR Company, Federal Way, WA (US);
Abstract
A method of classifying plant embryos according to their quality based on a general form of Lorenz-Bayes classifier is disclosed. First, image or spectral data of plant embryos of known quality are acquired, and the data are divided into two classes according to the embryos' known quality. Second, metrics are calculated from the acquired image or spectral data in each class. Third, multi-dimensional histograms of multiple metrics are prepared for both classes. Fourth, the difference or some other measure of comparison between the two multi-dimensional histograms is obtained. Fifth, image or spectral data of a plant embryo of unknown quality are obtained and metrics are calculated therefrom. Sixth, the embryo of unknown quality is assigned to a class based on its calculated metrics and the result of the comparison as calculated in the fourth step above.