The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Mar. 18, 2010
Applicants:

Veit Schier, Leinfelden-Echterdingen, DE;

Oliver Eibl, Kirchentellinsfurt, DE;

Wolfgang Engelhart, Metzingen, DE;

Inventors:

Veit Schier, Leinfelden-Echterdingen, DE;

Oliver Eibl, Kirchentellinsfurt, DE;

Wolfgang Engelhart, Metzingen, DE;

Assignee:

Walter AG, Tubingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/08 (2006.01); C23C 16/40 (2006.01); B23B 27/14 (2006.01);
U.S. Cl.
CPC ...
C23C 14/08 (2013.01); C23C 16/40 (2013.01); B23B 27/14 (2013.01); B23B 2228/08 (2013.01); B23B 2228/105 (2013.01);
Abstract

The invention relates to a cutting tool having a substrate base body and a single or multi-layered coating attached thereupon, wherein at least one layer of the coating is a metal oxide layer produced in the PVD process or in the CVD process and the metal oxide layer has a grain structure wherein there is structural disorder within a plurality of the existing grains that are characterized in that in electron diffraction images of the grains, point-shaped reflections occur up to a maximum lattice spacing dand for lattice spacing greater than dno point-shaped reflections occur, but rather a diffuse intensity distribution typical for amorphous structures.


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