The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Dec. 21, 2009
Applicants:

Martin Hacker, Jena, DE;

Ralf Ebersbach, Schmoelln, DE;

Thomas Pabst, Stadtroda, DE;

Ulf Peterlein, Jena, DE;

Gerard Antkowiak, Jena, DE;

Roland Bergner, Jena, DE;

Ingo Koschmieder, Jena, DE;

Inventors:

Martin Hacker, Jena, DE;

Ralf Ebersbach, Schmoelln, DE;

Thomas Pabst, Stadtroda, DE;

Ulf Peterlein, Jena, DE;

Gerard Antkowiak, Jena, DE;

Roland Bergner, Jena, DE;

Ingo Koschmieder, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for swept-source optical coherence domain reflectometry (SS OCDR) on moveable samples, particularly human eyes, for obtaining A-scans, having a measuring range according to the sample length and having a laser light source which can be adjusted by a main wave number kand at least one receiver for the light dissipated from the sample, wherein the sample is illuminated on the sample surface by a measurement beam having a diameter D by way of a coupling device. The light source has a spectral line width of δk<168 mand the adjustment of the light source is carried out in τ<44 s/(D*k).


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