The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2014

Filed:

Apr. 01, 2010
Applicant:

Chang Hun Yoo, Seoul, KR;

Inventor:

Chang Hun Yoo, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 17/00 (2006.01); G06F 17/30 (2006.01); G06K 7/10 (2006.01); G06K 19/00 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is related to a method for generating an image file for forgery verification and a method for forgery verification. A method for generating an image file for forgery verification according to the present invention consists of a generating a bit map of the image file, a generating a horizontal check logic, a vertical check logic, and a check logic of each region from the bit map, a generating a two-dimensional bar code from the horizontal check logic, the vertical check logic, and the check logic of each region, and a generating an image file for forgery verification into which the two-dimensional bar code is inserted. A method for forgery verification according to the present invention consists of a generating a first horizontal check logic, a first vertical check logic, and a first check logic of each region from the bit map by generating a bit map of an image file for forgery verification into which a two-dimensional bar code is inserted, a generating a second horizontal check logic, a second vertical check logic, and a second check logic of each region from the two-dimensional bar code, and a comparing the first and the second horizontal check logics, the first and the second vertical check logics, and the first and the second check logics of each region.


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