The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Jun. 26, 2008
Ivo W. Rangelow, Baunatal, DE;
Tzvetan Ivanov, Ilmenau, DE;
Burkhard Volland, Erfurt, DE;
Teodor Gotszalk, Wroclaw, PL;
Miroslaw Woszczyna, Wroclaw, PL;
Jerzy Mielczarski, Houdemont, FR;
Yanko Sarov, Kassel, DE;
Ivo W. Rangelow, Baunatal, DE;
Tzvetan Ivanov, Ilmenau, DE;
Burkhard Volland, Erfurt, DE;
Teodor Gotszalk, Wroclaw, PL;
Miroslaw Woszczyna, Wroclaw, PL;
Jerzy Mielczarski, Houdemont, FR;
Yanko Sarov, Kassel, DE;
Nano Analytik GmbH, Ilmenau, DE;
Abstract
The present invention relates to an apparatus and a method for investigating surface properties of different materials, which make it possible to carry out atomic force microscopy with a simplified and faster shear force method. The apparatus according to the invention is characterized by perpendicular orientation of the measuring tip of a self-actuated cantilever with respect to the surface of the sample. A piezoresistive sensor and a bimorph actuator are preferably DC-isolated. The measuring tip is in the form of a carbon nanotube, in particular. A plurality of cantilevers can be arranged in the form of a cantilever array which is characterized by a comb-like arrangement of individual pre-bent cantilevers. The method according to the invention is distinguished by a fast feedback signal on account of the distance between the measuring tip and the surface to be investigated being regulated using the change in a DC signal which supplies the actuator.