The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

Jun. 28, 2010
Applicants:

Venkataraman Kartik, Zurich, CH;

Charalampos Pozidis, Thalwil, CH;

Deepak R. Sahoo, Zurich, CH;

Abu Sebastian, Adliswil, CH;

Inventors:

Venkataraman Kartik, Zurich, CH;

Charalampos Pozidis, Thalwil, CH;

Deepak R. Sahoo, Zurich, CH;

Abu Sebastian, Adliswil, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 10/00 (2010.01); G01Q 20/02 (2010.01);
U.S. Cl.
CPC ...
Abstract

An apparatus is provided and includes a cantilever having a tip at a distal end thereof disposed with the tip positioned an initial distance from a sample and a circuit electrically coupled to a substrate on which the sample is layered and the cantilever to simultaneously apply direct and alternating currents to deflect the cantilever and to cause the tip to oscillate about a point at a second distance from the sample, which is shorter than the initial distance, between first positions, at which the tip contacts the sample, and second positions, at which the tip is displaced from the sample.


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