The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Sep. 11, 2009
Kathryn A. Bassin, Endicott, NY (US);
Howard M. Hess, Chicago, IL (US);
Steven Kagan, Oakbrook Terrace, IL (US);
Shao C. LI, Beijing, CN;
Zhong J. LI, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Atlanta, GA (US);
Hua F. Tan, Beijing, CN;
Jun Zhu, Shanghai, CN;
Kathryn A. Bassin, Endicott, NY (US);
Howard M. Hess, Chicago, IL (US);
Steven Kagan, Oakbrook Terrace, IL (US);
Shao C. Li, Beijing, CN;
Zhong J. Li, Beijing, CN;
He H. Liu, Beijing, CN;
Susan E. Skrabanek, Atlanta, GA (US);
Hua F. Tan, Beijing, CN;
Jun Zhu, Shanghai, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method includes creating an initial test plan including initial estimates of effort and defect distributions, creating an alternative test plan including alternative estimates of effort and defect distributions, and displaying at least one metric of the initial test plan and the alternative test plan side by side for comparison by a user.